Adaptive wavefront correction in two-photon microscopy using coherence-gated wavefront sensing

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Bibliographic Details
Main Author: Rückel, Markus (Author)
Format: Book/Monograph Thesis
Language:English
Published: 2006
Subjects:
Online Access: Get full text
Author Notes:presented by Markus Rückel
Description
Item Description:Zsfassung in dt. Sprache