Vapor pressure and evaporation coefficient measurements at elevated temperatures with a Knudsen cell and a quartz crystal microbalance: new data for SiO

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Bibliographische Detailangaben
Hauptverfasser: Wetzel, Steffen (VerfasserIn) , Pucci, Annemarie (VerfasserIn) , Gail, Hans-Peter (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: 2012
In: Journal of chemical & engineering data
Year: 2012, Jahrgang: 57, Heft: 5, Pages: 1594-1601
ISSN:1520-5134
DOI:110.1021/je300199a
Online-Zugang:Resolving-System, Volltext: http://dx.doi.org/110.1021/je300199a
Volltext
Verfasserangaben:Steffen Wetzel; Annemarie Pucci; Hans-Peter Gail

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