Cover Image

Optical and infrared interferometry: 23 - 27 June 2008, Marseille, France

Saved in:
Bibliographic Details
Corporate Author: SPIE, The International Society for Optical Engineering, Europe (Other)
Other Authors: Schöller, Markus (Editor)
Format: Conference Paper
Language:English
Published: Bellingham, Wash. SPIE 20XX-
Series:Proceedings of SPIE 7013
Volumes / Articles: Show Volumes / Articles.
Subjects:
Konferenzschrift
Online Access: Get full text
Author Notes:sponsored by SPIE; SPIE Europe. Markus Schöller ..., ed.
Description
ISBN:9780819472236

Similar Items