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|a Gaia on-board metrology: basic angle and best focus
|c A. Mora, M. Biermann, A.G.A. Brown, D. Busonero, L. Carminati, J.M. Carrasco, F. Chassat, M. Erdmann, W.L.M. Gielesen, C. Jordi, D. Katz, R. Kohley, L. Lindegren, W. Loeffler, O. Marchal, P. Panuzzo, G. Seabroke, J. Sahlmann, E. Serpell, I. Serraller, F. van Leeuwen, W. van Reeven, T.C. van den Doo, L.L.A. Vosteen
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