Strigari, F., & Haverkort, M. W. (2015). Quantitative study of valence and configuration interaction parameters of the Kondo semiconductors CeM 2Al 10 (M=Ru, Os and Fe) by means of bulk-sensitive hard X-ray photoelectron spectroscopy. Journal of electron spectroscopy and related phenomena, 199, . https://doi.org/10.1016/j.elspec.2015.01.004
Chicago-Zitierstil (17. Ausg.)Strigari, Fabio, und Maurits W. Haverkort. "Quantitative Study of Valence and Configuration Interaction Parameters of the Kondo Semiconductors CeM 2Al 10 (M=Ru, Os and Fe) by Means of Bulk-sensitive Hard X-ray Photoelectron Spectroscopy." Journal of Electron Spectroscopy and Related Phenomena 199 (2015). https://doi.org/10.1016/j.elspec.2015.01.004.
MLA-Zitierstil (9. Ausg.)Strigari, Fabio, und Maurits W. Haverkort. "Quantitative Study of Valence and Configuration Interaction Parameters of the Kondo Semiconductors CeM 2Al 10 (M=Ru, Os and Fe) by Means of Bulk-sensitive Hard X-ray Photoelectron Spectroscopy." Journal of Electron Spectroscopy and Related Phenomena, vol. 199, 2015, https://doi.org/10.1016/j.elspec.2015.01.004.