APA (7th ed.) Citation

Strigari, F., & Haverkort, M. W. (2015). Quantitative study of valence and configuration interaction parameters of the Kondo semiconductors CeM2Al10 (M = Ru, Os and Fe) by means of bulk-sensitive hard x-ray photoelectron spectroscopy. Arxiv.

Chicago Style (17th ed.) Citation

Strigari, Fabio, and Maurits W. Haverkort. "Quantitative Study of Valence and Configuration Interaction Parameters of the Kondo Semiconductors CeM2Al10 (M = Ru, Os and Fe) by Means of Bulk-sensitive Hard X-ray Photoelectron Spectroscopy." Arxiv 2015.

MLA (9th ed.) Citation

Strigari, Fabio, and Maurits W. Haverkort. "Quantitative Study of Valence and Configuration Interaction Parameters of the Kondo Semiconductors CeM2Al10 (M = Ru, Os and Fe) by Means of Bulk-sensitive Hard X-ray Photoelectron Spectroscopy." Arxiv, 2015.