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Life cycle assessment of silicon wafer processing for microelectronic chips and solar cells

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Bibliographic Details
Main Authors: Schmidt, Mario (Author) , Hottenroth, Heidi (Author) , Schottler, Martin (Author) , Fetzer, Gabriele (Author) , Schlüter, Birgit Alexandra (Author)
Format: Article (Journal)
Language:English
Published: 08 December 2011
In: The international journal of life cycle assessment
Year: 2012, Volume: 17, Issue: 2, Pages: 126-144
ISSN:1614-7502
DOI:10.1007/s11367-011-0351-1
Online Access:Verlag, kostenfrei, Volltext: https://link.springer.com/article/10.1007/s11367-011-0351-1
Verlag, kostenfrei, Volltext: https://doi.org/10.1007/s11367-011-0351-1
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Author Notes:Mario Schmidt, Heidi Hottenroth, Martin Schottler, Gabriele Fetzer, Birgit Schlüter
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Item Description:Gesehen am 15.02.2018
Physical Description:Online Resource
ISSN:1614-7502
DOI:10.1007/s11367-011-0351-1

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