Functionalized nickel oxide hole contact layers: work function versus conductivity
Nickel oxide (NiO) is a widely used material for efficient hole extraction in optoelectronic devices. However, its surface characteristics strongly depend on the processing history and exposure to adsorbates. To achieve controllability of the electronic and chemical properties of solution-processed...
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| Main Authors: | , , , , , , |
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| Format: | Article (Journal) |
| Language: | English |
| Published: |
2017
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| In: |
ACS applied materials & interfaces
Year: 2017, Volume: 9, Issue: 45, Pages: 39821-39829 |
| ISSN: | 1944-8252 |
| DOI: | 10.1021/acsami.7b12784 |
| Online Access: | Verlag, Volltext: http://dx.doi.org/10.1021/acsami.7b12784 Verlag, Volltext: https://doi.org/10.1021/acsami.7b12784 
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| Author Notes: | Sebastian Hietzschold, Sabina Hillebrandt, Florian Ullrich, Jakob Bombsch, Valentina Rohnacher, Shuangying Ma, Wenlan Liu, Andreas Köhn, Wolfram Jaegermann, Annemarie Pucci, Wolfgang Kowalsky, Eric Mankel, Sebastian Beck and Robert Lovrincic |
MARC
| LEADER | 00000caa a2200000 c 4500 | ||
|---|---|---|---|
| 001 | 1576521311 | ||
| 003 | DE-627 | ||
| 005 | 20220814165846.0 | ||
| 007 | cr uuu---uuuuu | ||
| 008 | 180619s2017 xx |||||o 00| ||eng c | ||
| 024 | 7 | |a 10.1021/acsami.7b12784 |2 doi | |
| 035 | |a (DE-627)1576521311 | ||
| 035 | |a (DE-576)506521311 | ||
| 035 | |a (DE-599)BSZ506521311 | ||
| 035 | |a (OCoLC)1341011757 | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rda | ||
| 041 | |a eng | ||
| 084 | |a 29 |2 sdnb | ||
| 100 | 1 | |a Hietzschold, Sebastian |d 1989- |e VerfasserIn |0 (DE-588)1150812133 |0 (DE-627)1011062763 |0 (DE-576)497272946 |4 aut | |
| 245 | 1 | 0 | |a Functionalized nickel oxide hole contact layers |b work function versus conductivity |c Sebastian Hietzschold, Sabina Hillebrandt, Florian Ullrich, Jakob Bombsch, Valentina Rohnacher, Shuangying Ma, Wenlan Liu, Andreas Köhn, Wolfram Jaegermann, Annemarie Pucci, Wolfgang Kowalsky, Eric Mankel, Sebastian Beck and Robert Lovrincic |
| 264 | 1 | |c 2017 | |
| 300 | |a 9 | ||
| 336 | |a Text |b txt |2 rdacontent | ||
| 337 | |a Computermedien |b c |2 rdamedia | ||
| 338 | |a Online-Ressource |b cr |2 rdacarrier | ||
| 500 | |a Publication date (web): October 20, 2017 | ||
| 500 | |a Gesehen am 19.06.2018 | ||
| 520 | |a Nickel oxide (NiO) is a widely used material for efficient hole extraction in optoelectronic devices. However, its surface characteristics strongly depend on the processing history and exposure to adsorbates. To achieve controllability of the electronic and chemical properties of solution-processed nickel oxide (sNiO), we functionalize its surface with a self-assembled monolayer (SAM) of 4-cyanophenylphosphonic acid. A detailed analysis of infrared and photoelectron spectroscopy shows the chemisorption of the molecules with a nominal layer thickness of around one monolayer and gives an insight into the chemical composition of the SAM. Density functional theory calculations reveal the possible binding configurations. By the application of the SAM, we increase the sNiO work function by up to 0.8 eV. When incorporated in organic solar cells, the increase in work function and improved energy level alignment to the donor does not lead to a higher fill factor of these cells. Instead, we observe the formation of a transport barrier, which can be reduced by increasing the conductivity of the sNiO through doping with copper oxide. We conclude that the widespread assumption of maximizing the fill factor by only matching the work function of the oxide charge extraction layer with the energy levels in the active material is a too narrow approach. Successful implementation of interface modifiers is only possible with a sufficiently high charge carrier concentration in the oxide interlayer to support efficient charge transfer across the interface. | ||
| 700 | 1 | |a Hillebrandt, Sabina |d 1987- |e VerfasserIn |0 (DE-588)107115737X |0 (DE-627)825616832 |0 (DE-576)432976299 |4 aut | |
| 700 | 1 | |a Bombsch, Jakob |e VerfasserIn |0 (DE-588)1161434011 |0 (DE-627)1024730611 |0 (DE-576)506520331 |4 aut | |
| 700 | 1 | |a Rohnacher, Valentina |d 1993- |e VerfasserIn |0 (DE-588)1161434429 |0 (DE-627)1024731324 |0 (DE-576)506521141 |4 aut | |
| 700 | 1 | |a Pucci, Annemarie |e VerfasserIn |0 (DE-588)1020648783 |0 (DE-627)691291969 |0 (DE-576)361698739 |4 aut | |
| 700 | 1 | |a Beck, Sebastian |d 1985- |e VerfasserIn |0 (DE-588)1063046300 |0 (DE-627)809003570 |0 (DE-576)42038488X |4 aut | |
| 700 | 1 | |a Lovrinčić, Robert |e VerfasserIn |0 (DE-588)138299900 |0 (DE-627)601107594 |0 (DE-576)307080560 |4 aut | |
| 773 | 0 | 8 | |i Enthalten in |a American Chemical Society |t ACS applied materials & interfaces |d Washington, DC : Soc., 2009 |g 9(2017), 45, Seite 39821-39829 |h Online-Ressource |w (DE-627)587139617 |w (DE-600)2467494-1 |w (DE-576)299311139 |x 1944-8252 |7 nnas |
| 773 | 1 | 8 | |g volume:9 |g year:2017 |g number:45 |g pages:39821-39829 |g extent:9 |a Functionalized nickel oxide hole contact layers work function versus conductivity |
| 856 | 4 | 0 | |u http://dx.doi.org/10.1021/acsami.7b12784 |x Verlag |x Resolving-System |3 Volltext |
| 856 | 4 | 0 | |u https://doi.org/10.1021/acsami.7b12784 |x Verlag |3 Volltext |
| 951 | |a AR | ||
| 992 | |a 20180619 | ||
| 993 | |a Article | ||
| 994 | |a 2017 | ||
| 998 | |g 138299900 |a Lovrinčić, Robert |m 138299900:Lovrinčić, Robert |p 14 |y j | ||
| 998 | |g 1063046300 |a Beck, Sebastian |m 1063046300:Beck, Sebastian |d 130000 |d 130700 |e 130000PB1063046300 |e 130700PB1063046300 |k 0/130000/ |k 1/130000/130700/ |p 13 | ||
| 998 | |g 1020648783 |a Pucci, Annemarie |m 1020648783:Pucci, Annemarie |d 130000 |d 130700 |e 130000PP1020648783 |e 130700PP1020648783 |k 0/130000/ |k 1/130000/130700/ |p 10 | ||
| 998 | |g 1161434429 |a Rohnacher, Valentina |m 1161434429:Rohnacher, Valentina |d 130000 |d 130700 |e 130000PR1161434429 |e 130700PR1161434429 |k 0/130000/ |k 1/130000/130700/ |p 5 | ||
| 998 | |g 1161434011 |a Bombsch, Jakob |m 1161434011:Bombsch, Jakob |d 130000 |d 130700 |e 130000PB1161434011 |e 130700PB1161434011 |k 0/130000/ |k 1/130000/130700/ |p 4 | ||
| 998 | |g 107115737X |a Hillebrandt, Sabina |m 107115737X:Hillebrandt, Sabina |d 130000 |d 130700 |e 130000PH107115737X |e 130700PH107115737X |k 0/130000/ |k 1/130000/130700/ |p 2 | ||
| 998 | |g 1150812133 |a Hietzschold, Sebastian |m 1150812133:Hietzschold, Sebastian |d 130000 |d 130700 |e 130000PH1150812133 |e 130700PH1150812133 |k 0/130000/ |k 1/130000/130700/ |p 1 |x j | ||
| 999 | |a KXP-PPN1576521311 |e 3013025085 | ||
| BIB | |a Y | ||
| SER | |a journal | ||
| JSO | |a {"relHost":[{"title":[{"title_sort":"ACS applied materials & interfaces","title":"ACS applied materials & interfaces"}],"recId":"587139617","corporate":[{"roleDisplay":"VerfasserIn","display":"American Chemical Society","role":"aut"}],"language":["eng"],"type":{"media":"Online-Ressource","bibl":"periodical"},"disp":"American Chemical SocietyACS applied materials & interfaces","note":["Gesehen am 27.08.2020"],"part":{"extent":"9","text":"9(2017), 45, Seite 39821-39829","volume":"9","issue":"45","pages":"39821-39829","year":"2017"},"titleAlt":[{"title":"Applied materials & interfaces"}],"pubHistory":["1.2009 -"],"name":{"displayForm":["American Chemical Society"]},"id":{"issn":["1944-8252"],"zdb":["2467494-1"],"eki":["587139617"]},"origin":[{"dateIssuedKey":"2009","publisher":"Soc.","dateIssuedDisp":"2009-","publisherPlace":"Washington, DC"}],"physDesc":[{"extent":"Online-Ressource"}]}],"physDesc":[{"extent":"9 S."}],"name":{"displayForm":["Sebastian Hietzschold, Sabina Hillebrandt, Florian Ullrich, Jakob Bombsch, Valentina Rohnacher, Shuangying Ma, Wenlan Liu, Andreas Köhn, Wolfram Jaegermann, Annemarie Pucci, Wolfgang Kowalsky, Eric Mankel, Sebastian Beck and Robert Lovrincic"]},"id":{"doi":["10.1021/acsami.7b12784"],"eki":["1576521311"]},"origin":[{"dateIssuedDisp":"2017","dateIssuedKey":"2017"}],"language":["eng"],"recId":"1576521311","type":{"media":"Online-Ressource","bibl":"article-journal"},"note":["Publication date (web): October 20, 2017","Gesehen am 19.06.2018"],"person":[{"display":"Hietzschold, Sebastian","roleDisplay":"VerfasserIn","role":"aut","family":"Hietzschold","given":"Sebastian"},{"family":"Hillebrandt","given":"Sabina","roleDisplay":"VerfasserIn","display":"Hillebrandt, Sabina","role":"aut"},{"role":"aut","roleDisplay":"VerfasserIn","display":"Bombsch, Jakob","given":"Jakob","family":"Bombsch"},{"family":"Rohnacher","given":"Valentina","display":"Rohnacher, Valentina","roleDisplay":"VerfasserIn","role":"aut"},{"given":"Annemarie","family":"Pucci","role":"aut","roleDisplay":"VerfasserIn","display":"Pucci, Annemarie"},{"given":"Sebastian","family":"Beck","role":"aut","roleDisplay":"VerfasserIn","display":"Beck, Sebastian"},{"role":"aut","roleDisplay":"VerfasserIn","display":"Lovrinčić, Robert","given":"Robert","family":"Lovrinčić"}],"title":[{"title_sort":"Functionalized nickel oxide hole contact layers","subtitle":"work function versus conductivity","title":"Functionalized nickel oxide hole contact layers"}]} | ||
| SRT | |a HIETZSCHOLFUNCTIONAL2017 | ||