Two-sided illumination in rigorous coupled-wave analysis applied to the 4π-microscope

We apply the rigorous coupled-wave analysis (RCWA) to the simulation of 4π-microscopy. To achieve this, the concept of structured illumination [J. Opt. Soc. Am. A31, 2385 (2014)] is combined with the idea of coherent two-sided light incidence. We show how the latter can be integrated into the framew...

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Hauptverfasser: Junker, André (VerfasserIn) , Brenner, Karl-Heinz (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: 8 September 2017
In: Journal of the Optical Society of America. A, Optics, image science, and vision
Year: 2017, Jahrgang: 34, Heft: 10, Pages: 1769-1775
ISSN:1520-8532
DOI:10.1364/JOSAA.34.001769
Online-Zugang:Verlag, Volltext: http://dx.doi.org/10.1364/JOSAA.34.001769
Verlag, Volltext: https://www.osapublishing.org/josaa/abstract.cfm?uri=josaa-34-10-1769
Volltext
Verfasserangaben:André Junker and Karl-Heinz Brenner

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