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Impact of intense laser pulses on the autoionization dynamics of the 2s2p doubly excited state of He

The photoionization of a helium atom by short intense laser pulses is studied theoretically in the vicinity of the 2s2p1P doubly excited state with the intention to investigate the impact of the intensity and duration of the exciting pulse on the dynamics of the autoionization process. For that purp...

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Hauptverfasser: Artemyev, Anton (VerfasserIn) , Cederbaum, Lorenz S. (VerfasserIn) , Demekhin, Philipp V. (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: 18 September 2017
In: Physical review
Year: 2017, Jahrgang: 96, Heft: 3
ISSN:2469-9934
DOI:10.1103/PhysRevA.96.033410
Online-Zugang:Verlag, Volltext: http://dx.doi.org/10.1103/PhysRevA.96.033410
Verlag, Volltext: https://link.aps.org/doi/10.1103/PhysRevA.96.033410
Volltext
Verfasserangaben:Anton N. Artemyev, Lorenz S. Cederbaum, and Philipp V. Demekhin
Beschreibung
Zusammenfassung:The photoionization of a helium atom by short intense laser pulses is studied theoretically in the vicinity of the 2s2p1P doubly excited state with the intention to investigate the impact of the intensity and duration of the exciting pulse on the dynamics of the autoionization process. For that purpose, we solve numerically the corresponding time-dependent Schrödinger equation by applying the time-dependent restricted-active-space configuration-interaction method (TD-RASCI). The present numerical results clearly demonstrate that the Fano interferences can be controlled by a single high-frequency pulse. As long as the pulse duration is comparable to the autoionization lifetime, varying the peak intensity of the pulse enables manipulation of the underlying Fano interference. In particular, the asymmetric profile observed for the 2s2p1P doubly excited state of He in the weak-field ionization can be smoothly transformed to a window-type interference profile.
Beschreibung:Gesehen am 10.08.2018
Beschreibung:Online Resource
ISSN:2469-9934
DOI:10.1103/PhysRevA.96.033410

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