The MuPix system-on-chip for the Mu3e experiment
Mu3e is a novel experiment searching for charged lepton flavor violation in the rare decay μ+→e+e−e+. Decay vertex position, decay time and particle momenta have to be precisely measured in order to reject both accidental and physics background. A silicon pixel tracker based on 50μm thin high voltag...
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| Main Authors: | , , , , , , , , , |
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| Format: | Article (Journal) |
| Language: | English |
| Published: |
2017
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| In: |
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment
Year: 2016, Volume: 845, Pages: 194-198 |
| ISSN: | 1872-9576 |
| DOI: | 10.1016/j.nima.2016.06.095 |
| Online Access: | Verlag, Volltext: http://dx.doi.org/10.1016/j.nima.2016.06.095 Verlag, Volltext: http://www.sciencedirect.com/science/article/pii/S0168900216306611 |
| Author Notes: | Heiko Augustin, Niklaus Berger, Sebastian Dittmeier, Carsten Grzesik, Jan Hammerich, Qinhua Huang, Lennart Huth, Moritz Kiehn, Alexandr Kozlinskiy, Frank Meier Aeschbacher, Ivan Perić, Ann-Kathrin Perrevoort, André Schöning, Shruti Shrestha, Dorothea vom Bruch, Frederik Wauters, Dirk Wiedner |
| Summary: | Mu3e is a novel experiment searching for charged lepton flavor violation in the rare decay μ+→e+e−e+. Decay vertex position, decay time and particle momenta have to be precisely measured in order to reject both accidental and physics background. A silicon pixel tracker based on 50μm thin high voltage monolithic active pixel sensors (HV-MAPS) in a 1T solenoidal magnetic field provides precise vertex and momentum information. The MuPix chip combines pixel sensor cells with integrated analog electronics and a periphery with a complete digital readout. The MuPix7 is the first HV-MAPS prototype implementing all functionalities of the final sensor including a readout state machine and high speed serialization with 1.25Gbit/s data output, allowing for a streaming readout in parallel to the data taking. The observed efficiency of the MuPix7 chip including the full readout system is ⩾99% in a high rate test beam. |
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| Item Description: | Available online 17June 2016 Gesehen am 14.08.2018 |
| Physical Description: | Online Resource |
| ISSN: | 1872-9576 |
| DOI: | 10.1016/j.nima.2016.06.095 |