APA (7th ed.) Citation

Kunzmann, K., & Kieser, M. (2018). Test-compatible confidence intervals for adaptive two-stage single-arm designs with binary endpoint. Biometrical journal, 60(1), . https://doi.org/10.1002/bimj.201700018

Chicago Style (17th ed.) Citation

Kunzmann, Kevin, and Meinhard Kieser. "Test-compatible Confidence Intervals for Adaptive Two-stage Single-arm Designs with Binary Endpoint." Biometrical Journal 60, no. 1 (2018). https://doi.org/10.1002/bimj.201700018.

MLA (9th ed.) Citation

Kunzmann, Kevin, and Meinhard Kieser. "Test-compatible Confidence Intervals for Adaptive Two-stage Single-arm Designs with Binary Endpoint." Biometrical Journal, vol. 60, no. 1, 2018, https://doi.org/10.1002/bimj.201700018.