Horstmann, H., Körber, C., Aydin, D., & Kuner, T. (2012). Serial section scanning electron microscopy (S3EM) on silicon wafers for ultra-structural volume imaging of cells and tissues. PLOS ONE, 7(4), . https://doi.org/10.1371/journal.pone.0035172
Chicago-Zitierstil (17. Ausg.)Horstmann, Heinz, Christoph Körber, Daniel Aydin, und Thomas Kuner. "Serial Section Scanning Electron Microscopy (S3EM) on Silicon Wafers for Ultra-structural Volume Imaging of Cells and Tissues." PLOS ONE 7, no. 4 (2012). https://doi.org/10.1371/journal.pone.0035172.
MLA-Zitierstil (9. Ausg.)Horstmann, Heinz, et al. "Serial Section Scanning Electron Microscopy (S3EM) on Silicon Wafers for Ultra-structural Volume Imaging of Cells and Tissues." PLOS ONE, vol. 7, no. 4, 2012, https://doi.org/10.1371/journal.pone.0035172.