Joos, J., & Carraro, T. (2010). Electrode reconstruction by FIB/SEM and microstructure modeling. ECS transactions, 28(11), . https://doi.org/10.1149/1.3495834
Chicago Style (17th ed.) CitationJoos, Jochen, and Thomas Carraro. "Electrode Reconstruction by FIB/SEM and Microstructure Modeling." ECS Transactions 28, no. 11 (2010). https://doi.org/10.1149/1.3495834.
MLA (9th ed.) CitationJoos, Jochen, and Thomas Carraro. "Electrode Reconstruction by FIB/SEM and Microstructure Modeling." ECS Transactions, vol. 28, no. 11, 2010, https://doi.org/10.1149/1.3495834.
Warning: These citations may not always be 100% accurate.