Electrode reconstruction by FIB/SEM and microstructure modeling
Polarization losses within solid oxide fuel cell electrodes are strongly related to microstructure characteristics and composition. High-resolution microstructure analysis is a sensible method to understand and improve electrode performance. This study presents the application of a dual-beam focused...
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Article (Journal) Chapter/Article |
| Language: | English |
| Published: |
2010
|
| In: |
ECS transactions
Year: 2010, Volume: 28, Issue: 11, Pages: 81-91 |
| ISSN: | 1938-6737 |
| DOI: | 10.1149/1.3495834 |
| Online Access: | Resolving-System, Volltext: http://dx.doi.org/10.1149/1.3495834 Verlag, Volltext: http://ecst.ecsdl.org/content/28/11/81 |
| Author Notes: | Jochen Joos, Bernd Rüger, Thomas Carraro, André Weber, Ellen Ivers-Tiffée |
MARC
| LEADER | 00000caa a22000002c 4500 | ||
|---|---|---|---|
| 001 | 1588540138 | ||
| 003 | DE-627 | ||
| 005 | 20220815121346.0 | ||
| 007 | cr uuu---uuuuu | ||
| 008 | 190311s2010 xx |||||o 00| ||eng c | ||
| 024 | 7 | |a 10.1149/1.3495834 |2 doi | |
| 035 | |a (DE-627)1588540138 | ||
| 035 | |a (DE-576)518540138 | ||
| 035 | |a (DE-599)BSZ518540138 | ||
| 035 | |a (OCoLC)1341041181 | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rda | ||
| 041 | |a eng | ||
| 084 | |a 27 |2 sdnb | ||
| 100 | 1 | |a Joos, Jochen |e VerfasserIn |0 (DE-588)1135215588 |0 (DE-627)89020487X |0 (DE-576)489711774 |4 aut | |
| 245 | 1 | 0 | |a Electrode reconstruction by FIB/SEM and microstructure modeling |c Jochen Joos, Bernd Rüger, Thomas Carraro, André Weber, Ellen Ivers-Tiffée |
| 246 | 3 | 0 | |a FIB / SEM |
| 264 | 1 | |c 2010 | |
| 300 | |a 12 | ||
| 336 | |a Text |b txt |2 rdacontent | ||
| 337 | |a Computermedien |b c |2 rdamedia | ||
| 338 | |a Online-Ressource |b cr |2 rdacarrier | ||
| 500 | |a Gesehen am 11.03.2019 | ||
| 520 | |a Polarization losses within solid oxide fuel cell electrodes are strongly related to microstructure characteristics and composition. High-resolution microstructure analysis is a sensible method to understand and improve electrode performance. This study presents the application of a dual-beam focused ion beam/scanning electron microscope (FIB/SEM) for the three-dimensional (3D) reconstruction of a high performance LSCF-cathode. Error sources arising from FIB slicing and SEM sequencing are identified and methods of correction are presented. The corrected reconstruction data representing altogether a volume of ~ 2800µm3 are the basis for the calculation of the microstructure parameters (i) surface area, (ii) volume/porosity fraction and (iii) tortuosity. These parameters constitute the basis to calculate cathode performance via simplified microstructure models (1-3). Furthermore we present a detailed 3D finite element method (FEM) model to calculate the tortuosity from the accurately reconstructed 3D FIB/SEM data. This model has been extended to calculate electrode performance (ASRcat) from the 3D reconstruction. | ||
| 700 | 1 | |a Carraro, Thomas |e VerfasserIn |0 (DE-588)13134868X |0 (DE-627)507963369 |0 (DE-576)25094829X |4 aut | |
| 773 | 0 | 8 | |i Enthalten in |a Electrochemical Society |t ECS transactions |d Pennington, NJ : [Verlag nicht ermittelbar], 2005 |g 28(2010), 11, Seite 81-91 |h Online-Ressource |w (DE-627)518103110 |w (DE-600)2251888-5 |w (DE-576)277054001 |x 1938-6737 |
| 773 | 1 | 8 | |g volume:28 |g year:2010 |g number:11 |g pages:81-91 |g extent:12 |a Electrode reconstruction by FIB/SEM and microstructure modeling |
| 856 | 4 | 0 | |u http://dx.doi.org/10.1149/1.3495834 |x Resolving-System |x Verlag |3 Volltext |
| 856 | 4 | 0 | |u http://ecst.ecsdl.org/content/28/11/81 |x Verlag |3 Volltext |
| 951 | |a AR | ||
| 992 | |a 20190311 | ||
| 993 | |a Article | ||
| 994 | |a 2010 | ||
| 998 | |g 13134868X |a Carraro, Thomas |m 13134868X:Carraro, Thomas |d 110000 |d 110200 |d 110000 |d 110400 |e 110000PC13134868X |e 110200PC13134868X |e 110000PC13134868X |e 110400PC13134868X |k 0/110000/ |k 1/110000/110200/ |k 0/110000/ |k 1/110000/110400/ |p 3 | ||
| 999 | |a KXP-PPN1588540138 |e 3057983278 | ||
| BIB | |a Y | ||
| JSO | |a {"title":[{"title_sort":"Electrode reconstruction by FIB/SEM and microstructure modeling","title":"Electrode reconstruction by FIB/SEM and microstructure modeling"}],"person":[{"family":"Joos","given":"Jochen","display":"Joos, Jochen","roleDisplay":"VerfasserIn","role":"aut"},{"display":"Carraro, Thomas","roleDisplay":"VerfasserIn","role":"aut","family":"Carraro","given":"Thomas"}],"type":{"media":"Online-Ressource","bibl":"chapter"},"note":["Gesehen am 11.03.2019"],"language":["eng"],"recId":"1588540138","origin":[{"dateIssuedDisp":"2010","dateIssuedKey":"2010"}],"id":{"eki":["1588540138"],"doi":["10.1149/1.3495834"]},"name":{"displayForm":["Jochen Joos, Bernd Rüger, Thomas Carraro, André Weber, Ellen Ivers-Tiffée"]},"physDesc":[{"extent":"12 S."}],"relHost":[{"title":[{"title":"ECS transactions","subtitle":"ECST","title_sort":"ECS transactions"}],"pubHistory":["1.2005 -"],"titleAlt":[{"title":"ECST"}],"part":{"year":"2010","pages":"81-91","issue":"11","text":"28(2010), 11, Seite 81-91","volume":"28","extent":"12"},"disp":"Electrochemical SocietyECS transactions","type":{"bibl":"serial","media":"Online-Ressource"},"note":["Gesehen am 05.07.21"],"recId":"518103110","corporate":[{"role":"aut","roleDisplay":"VerfasserIn","display":"Electrochemical Society"}],"language":["eng"],"origin":[{"publisher":"[Verlag nicht ermittelbar]","dateIssuedKey":"2005","dateIssuedDisp":"2005-","publisherPlace":"Pennington, NJ"}],"id":{"zdb":["2251888-5"],"eki":["518103110"],"issn":["1938-6737"]},"name":{"displayForm":["Electrochemical Society"]},"physDesc":[{"extent":"Online-Ressource"}]}]} | ||
| SRT | |a JOOSJOCHENELECTRODER2010 | ||