Investigation of an amorphous silicon flat-panel detector for ion radiography
Gespeichert in:
| 1. Verfasser: | |
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| Dokumenttyp: | Buch/Monographie Hochschulschrift |
| Sprache: | Englisch |
| Veröffentlicht: |
2012
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| DOI: | 10.11588/heidok.00013590 |
| Schlagworte: | |
| Online-Zugang: | Resolving-System, kostenfrei, Volltext: http://nbn-resolving.de/urn:nbn:de:bsz:16-opus-135904 Resolving-System, Volltext: https://nbn-resolving.org/urn:nbn:de:bsz:16-opus-135904 Langzeitarchivierung Nationalbibliothek, Volltext: http://d-nb.info/1179785657/34 Verlag, kostenfrei, Volltext: http://www.ub.uni-heidelberg.de/archiv/13590 Resolving-System, Unbekannt: https://doi.org/10.11588/heidok.00013590 
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| Verfasserangaben: | presented by Julia Telsemeyer |
MARC
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| 245 | 1 | 0 | |a Investigation of an amorphous silicon flat-panel detector for ion radiography |c presented by Julia Telsemeyer |
| 247 | 1 | 0 | |a Untersuchung eines Flachbilddetektors für Ionenradiographie |f Übers. des Hauptsacht. |
| 264 | 1 | |c 2012 | |
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