International Conference on Optical Particle Characterization (OPC 2014): 10 - 14 March 2014, Tokyo, Japan
Gespeichert in:
| Körperschaften: | , |
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| Weitere Verfasser: | |
| Dokumenttyp: | Konferenzschrift |
| Sprache: | Englisch |
| Veröffentlicht: |
Tokyo
2014
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| Schriftenreihe: | Proc. SPIE
9232 |
| In: |
Proceedings of SPIE (9232)
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| Volumes / Articles: | Show Volumes / Articles. |
| Schlagworte: | |
| Online-Zugang: | Digitalisierung, Inhaltsverzeichnis: http://www.google.de/url?sa=t&rct=j&q=&esrc=s&source=web&cd=10&ved=0CGQQFjAJ&url=http%3A%2F%2Fproceedings.spiedigitallibrary.org%2Fdata%2FConferences%2FSPIEP%2F80388%2F923201.pdf&ei=kbIBVYu5D4v1UJephMAH&usg=AFQjCNEeVlTHoZLJpXVcvgMryTNw88budg&bvm=bv.87920726,d.d24&cad=rja
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| Verfasserangaben: | host. by: National Institute of Advanced Industrial Science and Technology (AIST) (Japan). Nobuhiro Aya ... eds. |
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