APA (7th ed.) Citation

Soldat, J. (2018). Characterization, operation and wafer-level testing of an ultra-fast 4k pixel readout ASIC for the DSSC x-ray detector at the European XFEL. https://doi.org/10.11588/heidok.00024041

Chicago Style (17th ed.) Citation

Soldat, Jan. Characterization, Operation and Wafer-level Testing of an Ultra-fast 4k Pixel Readout ASIC for the DSSC X-ray Detector at the European XFEL. Heidelberg, 2018. https://doi.org/10.11588/heidok.00024041.

MLA (9th ed.) Citation

Soldat, Jan. Characterization, Operation and Wafer-level Testing of an Ultra-fast 4k Pixel Readout ASIC for the DSSC X-ray Detector at the European XFEL. 2018. https://doi.org/10.11588/heidok.00024041.