Characterization, operation and wafer-level testing of an ultra-fast 4k pixel readout ASIC for the DSSC x-ray detector at the European XFEL
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Dokumenttyp: | Buch/Monographie Hochschulschrift |
| Sprache: | Englisch |
| Veröffentlicht: |
Heidelberg
2018
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| DOI: | 10.11588/heidok.00024041 |
| Schlagworte: | |
| Online-Zugang: | Resolving-System, kostenfrei, Volltext: http://dx.doi.org/10.11588/heidok.00024041 Resolving-System, kostenfrei, Volltext: http://nbn-resolving.de/urn:nbn:de:bsz:16-heidok-240415 Resolving-System, Volltext: https://nbn-resolving.org/urn:nbn:de:bsz:16-heidok-240415 Langzeitarchivierung Nationalbibliothek, Volltext: http://d-nb.info/1177691531/34 Verlag, kostenfrei, Volltext: http://www.ub.uni-heidelberg.de/archiv/24041 Resolving-System, Unbekannt: https://doi.org/10.11588/heidok.00024041 
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| Verfasserangaben: | put forward by Dipl.-Phys. Jan Soldat ; referees: Prof. Dr. Peter Fischer [und ein weiterer Gutachter] |
MARC
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| 245 | 1 | 0 | |a Characterization, operation and wafer-level testing of an ultra-fast 4k pixel readout ASIC for the DSSC x-ray detector at the European XFEL |c put forward by Dipl.-Phys. Jan Soldat ; referees: Prof. Dr. Peter Fischer [und ein weiterer Gutachter] |
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