Laser frequency stabilization using a commercial wavelength meter

We present the characterization of a laser frequency stabilization scheme using a state-of-the-art wavelength meter based on solid Fizeau interferometers. For a frequency-doubled Ti-sapphire laser operated at 461 nm, an absolute Allan deviation below 10−9 with a standard deviation of 1 MHz over 10 h...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Couturier, Luc (VerfasserIn) , Nosske, Ingo (VerfasserIn) , Hu, Fachao (VerfasserIn) , Tan, Canzhu (VerfasserIn) , Qiao, Chang (VerfasserIn) , Jiang, Yuhai (VerfasserIn) , Chen, Peng (VerfasserIn) , Weidemüller, Matthias (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: 13 April 2018
In: Review of scientific instruments
Year: 2018, Jahrgang: 89, Heft: 4
ISSN:1089-7623
DOI:10.1063/1.5025537
Online-Zugang:Verlag, Volltext: https://doi.org/10.1063/1.5025537
Verlag, Volltext: https://aip.scitation.org/doi/10.1063/1.5025537
Volltext
Verfasserangaben:Luc Couturier, Ingo Nosske, Fachao Hu, Canzhu Tan, Chang Qiao, Y. H. Jiang, Peng Chen, and Matthias Weidemüller

MARC

LEADER 00000caa a2200000 c 4500
001 1668301024
003 DE-627
005 20220816181920.0
007 cr uuu---uuuuu
008 190702s2018 xx |||||o 00| ||eng c
024 7 |a 10.1063/1.5025537  |2 doi 
035 |a (DE-627)1668301024 
035 |a (DE-599)KXP1668301024 
035 |a (OCoLC)1341231763 
040 |a DE-627  |b ger  |c DE-627  |e rda 
041 |a eng 
084 |a 29  |2 sdnb 
100 1 |a Couturier, Luc  |e VerfasserIn  |0 (DE-588)1189679531  |0 (DE-627)1668302047  |4 aut 
245 1 0 |a Laser frequency stabilization using a commercial wavelength meter  |c Luc Couturier, Ingo Nosske, Fachao Hu, Canzhu Tan, Chang Qiao, Y. H. Jiang, Peng Chen, and Matthias Weidemüller 
264 1 |c 13 April 2018 
300 |a 5 
336 |a Text  |b txt  |2 rdacontent 
337 |a Computermedien  |b c  |2 rdamedia 
338 |a Online-Ressource  |b cr  |2 rdacarrier 
500 |a Gesehen am 02.07.2019 
520 |a We present the characterization of a laser frequency stabilization scheme using a state-of-the-art wavelength meter based on solid Fizeau interferometers. For a frequency-doubled Ti-sapphire laser operated at 461 nm, an absolute Allan deviation below 10−9 with a standard deviation of 1 MHz over 10 h is achieved. Using this laser for cooling and trapping of strontium atoms, the wavemeter scheme provides excellent stability in single-channel operation. Multi-channel operation with a multimode fiber switch results in fluctuations of the atomic fluorescence correlated to residual frequency excursions of the laser. The wavemeter-based frequency stabilization scheme can be applied to a wide range of atoms and molecules for laser spectroscopy, cooling, and trapping. 
700 1 |a Nosske, Ingo  |e VerfasserIn  |4 aut 
700 1 |a Hu, Fachao  |e VerfasserIn  |4 aut 
700 1 |a Tan, Canzhu  |e VerfasserIn  |0 (DE-588)1247553647  |0 (DE-627)1782088644  |4 aut 
700 1 |a Qiao, Chang  |e VerfasserIn  |4 aut 
700 1 |a Jiang, Yuhai  |d 1969-  |e VerfasserIn  |0 (DE-588)131985809  |0 (DE-627)516335987  |0 (DE-576)298877724  |4 aut 
700 1 |a Chen, Peng  |e VerfasserIn  |4 aut 
700 1 |a Weidemüller, Matthias  |e VerfasserIn  |0 (DE-588)1044143363  |0 (DE-627)771579551  |0 (DE-576)175232601  |4 aut 
773 0 8 |i Enthalten in  |t Review of scientific instruments  |d [Melville, NY] : AIP Publishing, 1930  |g 89(2018,4) Artikel-Nummer 043103, Seite 1-5, 5 Seiten  |h Online-Ressource  |w (DE-627)268759324  |w (DE-600)1472905-2  |w (DE-576)077609948  |x 1089-7623  |7 nnas  |a Laser frequency stabilization using a commercial wavelength meter 
773 1 8 |g volume:89  |g year:2018  |g number:4  |g extent:5  |a Laser frequency stabilization using a commercial wavelength meter 
856 4 0 |u https://doi.org/10.1063/1.5025537  |x Verlag  |x Resolving-System  |3 Volltext 
856 4 0 |u https://aip.scitation.org/doi/10.1063/1.5025537  |x Verlag  |3 Volltext 
951 |a AR 
992 |a 20190702 
993 |a Article 
994 |a 2018 
998 |g 1044143363  |a Weidemüller, Matthias  |m 1044143363:Weidemüller, Matthias  |d 130000  |d 130200  |e 130000PW1044143363  |e 130200PW1044143363  |k 0/130000/  |k 1/130000/130200/  |p 8  |y j 
999 |a KXP-PPN1668301024  |e 3490459261 
BIB |a Y 
SER |a journal 
JSO |a {"note":["Gesehen am 02.07.2019"],"title":[{"title":"Laser frequency stabilization using a commercial wavelength meter","title_sort":"Laser frequency stabilization using a commercial wavelength meter"}],"person":[{"given":"Luc","role":"aut","roleDisplay":"VerfasserIn","display":"Couturier, Luc","family":"Couturier"},{"role":"aut","given":"Ingo","roleDisplay":"VerfasserIn","family":"Nosske","display":"Nosske, Ingo"},{"roleDisplay":"VerfasserIn","family":"Hu","display":"Hu, Fachao","role":"aut","given":"Fachao"},{"role":"aut","given":"Canzhu","display":"Tan, Canzhu","family":"Tan","roleDisplay":"VerfasserIn"},{"role":"aut","given":"Chang","family":"Qiao","display":"Qiao, Chang","roleDisplay":"VerfasserIn"},{"given":"Yuhai","role":"aut","roleDisplay":"VerfasserIn","family":"Jiang","display":"Jiang, Yuhai"},{"display":"Chen, Peng","family":"Chen","roleDisplay":"VerfasserIn","role":"aut","given":"Peng"},{"role":"aut","given":"Matthias","roleDisplay":"VerfasserIn","family":"Weidemüller","display":"Weidemüller, Matthias"}],"type":{"bibl":"article-journal","media":"Online-Ressource"},"language":["eng"],"id":{"eki":["1668301024"],"doi":["10.1063/1.5025537"]},"physDesc":[{"extent":"5 S."}],"recId":"1668301024","name":{"displayForm":["Luc Couturier, Ingo Nosske, Fachao Hu, Canzhu Tan, Chang Qiao, Y. H. Jiang, Peng Chen, and Matthias Weidemüller"]},"relHost":[{"corporate":[{"roleDisplay":"Herausgebendes Organ","display":"American Institute of Physics","role":"isb"}],"part":{"extent":"5","issue":"4","text":"89(2018,4) Artikel-Nummer 043103, Seite 1-5, 5 Seiten","year":"2018","volume":"89"},"name":{"displayForm":["publ. by the American Institute of Physics"]},"pubHistory":["1.1930 -"],"disp":"Laser frequency stabilization using a commercial wavelength meterReview of scientific instruments","origin":[{"publisher":"AIP Publishing ; American Institute of Physics","dateIssuedDisp":"2013-","publisherPlace":"[Melville, NY] ; [Woodbury, Long Island, NY]","dateIssuedKey":"2013"}],"type":{"media":"Online-Ressource","bibl":"periodical"},"title":[{"title_sort":"Review of scientific instruments","subtitle":"a monthly journal devoted to scientific instruments, apparatus, and techniques","title":"Review of scientific instruments"}],"note":["Gesehen am 12.07.24"],"recId":"268759324","physDesc":[{"extent":"Online-Ressource"}],"id":{"eki":["268759324"],"issn":["1089-7623"],"zdb":["1472905-2"]},"language":["eng"]}],"origin":[{"dateIssuedDisp":"13 April 2018","dateIssuedKey":"2018"}]} 
SRT |a COUTURIERLLASERFREQU1320