APA (7th ed.) Citation

Maier, J. (2019). Artifact correction and real-time scatter estimation for X-ray computed tomography in industrial metrology. https://doi.org/10.11588/heidok.00026701

Chicago Style (17th ed.) Citation

Maier, Joscha. Artifact Correction and Real-time Scatter Estimation for X-ray Computed Tomography in Industrial Metrology. Heidelberg, 2019. https://doi.org/10.11588/heidok.00026701.

MLA (9th ed.) Citation

Maier, Joscha. Artifact Correction and Real-time Scatter Estimation for X-ray Computed Tomography in Industrial Metrology. 2019. https://doi.org/10.11588/heidok.00026701.