Artifact correction and real-time scatter estimation for X-ray computed tomography in industrial metrology

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Bibliographic Details
Main Author:	Maier, Joscha (Author)
Format:	Book/Monograph Thesis
Language:	English
Published:	Heidelberg 2019
DOI:	10.11588/heidok.00026701
Subjects:	Hochschulschrift
Online Access:	Verlag, kostenfrei, Volltext: https://nbn-resolving.de/urn:nbn:de:bsz:16-heidok-267010 Verlag, kostenfrei, Volltext: http://dx.doi.org/10.11588/heidok.00026701 Verlag, kostenfrei, Volltext: http://www.ub.uni-heidelberg.de/archiv/26701 Langzeitarchivierung Nationalbibliothek, Volltext: http://d-nb.info/1191760596/34 Resolving-System, Volltext: https://nbn-resolving.org/urn:nbn:de:bsz:16-heidok-267010 Resolving-System, Unbekannt: https://doi.org/10.11588/heidok.00026701
Author Notes:	put forward by M.Sc. Joscha Maier

Artifact correction and real-time scatter estimation for X-ray computed tomography in industrial metrology by Maier, Joscha (Author)

[2019?]

Book/Monograph Thesis