APA (7th ed.) Citation

Schuh, M. (2019). Simulations of the image charge effect in high-precision Penning traps and the new IGISOL ion buncher. https://doi.org/10.11588/heidok.00026485

Chicago Style (17th ed.) Citation

Schuh, Marc. Simulations of the Image Charge Effect in High-precision Penning Traps and the New IGISOL Ion Buncher. Heidelberg, 2019. https://doi.org/10.11588/heidok.00026485.

MLA (9th ed.) Citation

Schuh, Marc. Simulations of the Image Charge Effect in High-precision Penning Traps and the New IGISOL Ion Buncher. 2019. https://doi.org/10.11588/heidok.00026485.