Schuh, M. (2019). Simulations of the image charge effect in high-precision Penning traps and the new IGISOL ion buncher.
Chicago Style (17th ed.) CitationSchuh, Marc. Simulations of the Image Charge Effect in High-precision Penning Traps and the New IGISOL Ion Buncher. Heidelberg, 2019.
MLA (9th ed.) CitationSchuh, Marc. Simulations of the Image Charge Effect in High-precision Penning Traps and the New IGISOL Ion Buncher. 2019.
Warning: These citations may not always be 100% accurate.