Simulations of the image charge effect in high-precision Penning traps and the new IGISOL ion buncher
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Simulations of the image charge effect in high-precision Penning traps and the new IGISOL ion buncher
2019
- Resolving-System, kostenfrei, Volltext
- Resolving-System, kostenfrei, Volltext
- Verlag, kostenfrei, Volltext
- Langzeitarchivierung Nationalbibliothek, Volltext
- Resolving-System, Volltext
- Resolving-System, Unbekannt
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