Piezoelectricity enhancement of P(VDF/TrFE) by X-ray irradiation

Organic electronics is becoming more and more important because the low level of fabrication and deposition complexity even at large scale makes it a good candidate for future low cost technological product development. P(VDF-TrFE) is a co-polymer of special interest due its ferroelectric property e...

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Main Authors: Pilet, Nicolas (Author) , Khikhlovskyi, Vsevolod (Author) , Breemen, Albert J. J. M. van (Author) , Michels, Jasper J. (Author) , Kemerink, Martijn (Author) , Gelinck, Gerwin (Author) , Warnicke, P. (Author) , Bernard, Laetitia (Author)
Format: Article (Journal)
Language:English
Published: 12 July 2016
In: Organic electronics
Year: 2016, Volume: 37, Pages: 257-262
DOI:10.1016/j.orgel.2016.06.039
Online Access:Verlag, Volltext: https://doi.org/10.1016/j.orgel.2016.06.039
Verlag, Volltext: http://www.sciencedirect.com/science/article/pii/S1566119916302968
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Author Notes:N. Pilet, V. Khikhlovskyi, A.J.J.M. van Breemen, J.J. Michels, M. Kemerink, G. Gelinck, P. Warnicke, L. Bernard
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Summary:Organic electronics is becoming more and more important because the low level of fabrication and deposition complexity even at large scale makes it a good candidate for future low cost technological product development. P(VDF-TrFE) is a co-polymer of special interest due its ferroelectric property enabling usage in re-programmable non-volatile organic memory and magnetoelectric sensors. Piezo force microscopy (PFM) provides access to the technologically relevant ferroelectric polarisability and its remanent polarization via imaging of the piezoelectric property. Here we use PFM to show that piezoelectric response of a P(VDF-TrFE) film can be enhanced by up to 260 % after soft X-ray irradiation. This enhancement correlates with morphological change of part of the film, from amorphous to crystalline. An optimal irradiation dose is found above which the film gets eroded and the piezoelectric response gets lowered.
Item Description:Gesehen am 02.12.2019
Physical Description:Online Resource
DOI:10.1016/j.orgel.2016.06.039