APA (7th ed.) Citation

Reenen, S. v., & Kemerink, M. (2014). Correcting for contact geometry in Seebeck coefficient measurements of thin film devices. Organic electronics, 15(10), . https://doi.org/10.1016/j.orgel.2014.06.018

Chicago Style (17th ed.) Citation

Reenen, Stephan van, and Martijn Kemerink. "Correcting for Contact Geometry in Seebeck Coefficient Measurements of Thin Film Devices." Organic Electronics 15, no. 10 (2014). https://doi.org/10.1016/j.orgel.2014.06.018.

MLA (9th ed.) Citation

Reenen, Stephan van, and Martijn Kemerink. "Correcting for Contact Geometry in Seebeck Coefficient Measurements of Thin Film Devices." Organic Electronics, vol. 15, no. 10, 2014, https://doi.org/10.1016/j.orgel.2014.06.018.