Sharma, A., Mathijssen, S. G. J., Smits, E. C. P., Kemerink, M., Leeuw, D. M. d., & Bobbert, P. A. (2010). Proton migration mechanism for operational instabilities in organic field-effect transistors. Physical review. B, Condensed matter and materials physics, 82(7), . https://doi.org/10.1103/PhysRevB.82.075322
Chicago-Zitierstil (17. Ausg.)Sharma, Abhinav, Simon G. J. Mathijssen, E. C. P. Smits, Martijn Kemerink, Dago M. de Leeuw, und Peter A. Bobbert. "Proton Migration Mechanism for Operational Instabilities in Organic Field-effect Transistors." Physical Review. B, Condensed Matter and Materials Physics 82, no. 7 (2010). https://doi.org/10.1103/PhysRevB.82.075322.
MLA-Zitierstil (9. Ausg.)Sharma, Abhinav, et al. "Proton Migration Mechanism for Operational Instabilities in Organic Field-effect Transistors." Physical Review. B, Condensed Matter and Materials Physics, vol. 82, no. 7, 2010, https://doi.org/10.1103/PhysRevB.82.075322.