Temperature-dependent built-in potential in organic semiconductor devices

The temperature dependence of the built-in voltage of organic semiconductor devices is studied. The results are interpreted using a simple analytical model for the band bending at the electrodes. It is based on the notion that, even at zero current, diffusion may cause a significant charge density i...

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Bibliographic Details
Main Authors: Kemerink, Martijn (Author) , Kramer, J. M. (Author) , Gommans, Hendrikus Hubertus Petrus (Author) , Janssen, René A. J. (Author)
Format: Article (Journal)
Language:English
Published: 12 May 2006
In: Applied physics letters
Year: 2006, Volume: 88, Issue: 19
ISSN:1077-3118
DOI:10.1063/1.2205007
Online Access:Verlag, Volltext: https://doi.org/10.1063/1.2205007
Verlag, Volltext: https://aip.scitation.org/doi/full/10.1063/1.2205007
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Author Notes:M. Kemerink, J.M. Kramer, H.H.P. Gommans, R.A.J. Janssen
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Summary:The temperature dependence of the built-in voltage of organic semiconductor devices is studied. The results are interpreted using a simple analytical model for the band bending at the electrodes. It is based on the notion that, even at zero current, diffusion may cause a significant charge density in the entire device, and hence a temperature dependent band bending. Both magnitude and temperature dependence of the built-in potential of various devices are consistently described by the model, as the effects of a thin LiF layer between cathode and active layer.
Item Description:Gesehen am 11.12.2019
Physical Description:Online Resource
ISSN:1077-3118
DOI:10.1063/1.2205007