APA (7th ed.) Citation

Kemerink, M., Reusch, T., Bruls, D. M., Koenraad, P. M., Salemink, H. W., & Wolter, J. H. (2002). Quantitative determination of the charge density on surface steps on semiconductors by high-resolution local scanning-tunneling spectroscopy. Physica. E, Low-dimensional systems & nanostructures, 13(2), . https://doi.org/10.1016/S1386-9477(02)00326-0

Chicago Style (17th ed.) Citation

Kemerink, Martijn, Thilo Reusch, Dominique Maria Bruls, Paulus M. Koenraad, Huub W. Salemink, and Joachim H. Wolter. "Quantitative Determination of the Charge Density on Surface Steps on Semiconductors by High-resolution Local Scanning-tunneling Spectroscopy." Physica. E, Low-dimensional Systems & Nanostructures 13, no. 2 (2002). https://doi.org/10.1016/S1386-9477(02)00326-0.

MLA (9th ed.) Citation

Kemerink, Martijn, et al. "Quantitative Determination of the Charge Density on Surface Steps on Semiconductors by High-resolution Local Scanning-tunneling Spectroscopy." Physica. E, Low-dimensional Systems & Nanostructures, vol. 13, no. 2, 2002, https://doi.org/10.1016/S1386-9477(02)00326-0.