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Quantitative determination of the charge density on surface steps on semiconductors by high-resolution local scanning-tunneling spectroscopy

A novel technique is developed to follow the energetic position of the conduction and valence bands with respect to the Fermi level as a function of the lateral position on semiconductor surfaces. By combining high-resolution scanning-tunneling spectroscopy measurements with model calculations it is...

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Main Authors: Kemerink, Martijn (Author) , Reusch, Thilo (Author) , Bruls, Dominique Maria (Author) , Koenraad, Paulus M. (Author) , Salemink, Huub W. (Author) , Wolter, Joachim H. (Author)
Format: Article (Journal)
Language:English
Published: 3 February 2002
In: Physica. E, Low-dimensional systems & nanostructures
Year: 2002, Volume: 13, Issue: 2, Pages: 1159-1162
ISSN:1386-9477
DOI:10.1016/S1386-9477(02)00326-0
Online Access:Verlag, Volltext: https://doi.org/10.1016/S1386-9477(02)00326-0
Verlag, Volltext: http://www.sciencedirect.com/science/article/pii/S1386947702003260
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Author Notes:M. Kemerink, T.C.G. Reusch, D.M. Bruls, P.M. Koenraad, H.W.M. Salemink, J.H. Wolter

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