Kemerink, M., Offermans, P., Koenraad, P. M., Duren, J. K. J. v., Janssen, R. A. J., Salemink, H. W., & Wolter, J. H. (2002). Measuring the potential distribution inside soft organic semiconductors with a scanning-tunneling microscope. Physica. E, Low-dimensional systems & nanostructures, 13(2), . https://doi.org/10.1016/S1386-9477(02)00346-6
Chicago-Zitierstil (17. Ausg.)Kemerink, Martijn, Peter Offermans, Paulus M. Koenraad, Jeroen Karolus Johannes van Duren, René A. J. Janssen, Huub W. Salemink, und Joachim H. Wolter. "Measuring the Potential Distribution Inside Soft Organic Semiconductors with a Scanning-tunneling Microscope." Physica. E, Low-dimensional Systems & Nanostructures 13, no. 2 (2002). https://doi.org/10.1016/S1386-9477(02)00346-6.
MLA-Zitierstil (9. Ausg.)Kemerink, Martijn, et al. "Measuring the Potential Distribution Inside Soft Organic Semiconductors with a Scanning-tunneling Microscope." Physica. E, Low-dimensional Systems & Nanostructures, vol. 13, no. 2, 2002, https://doi.org/10.1016/S1386-9477(02)00346-6.