APA-Zitierstil (7. Ausg.)

Charrier, D. S. H., Kemerink, M., Smalbrugge, B. E., Vries, T. d., & Janssen, R. A. J. (2008). Real versus measured surface potentials in scanning Kelvin probe microscopy. ACS nano, 2(4), . https://doi.org/10.1021/nn700190t

Chicago-Zitierstil (17. Ausg.)

Charrier, Dimitri S. H., Martijn Kemerink, Barry E. Smalbrugge, Tjibbe de Vries, und René A. J. Janssen. "Real Versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy." ACS Nano 2, no. 4 (2008). https://doi.org/10.1021/nn700190t.

MLA-Zitierstil (9. Ausg.)

Charrier, Dimitri S. H., et al. "Real Versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy." ACS Nano, vol. 2, no. 4, 2008, https://doi.org/10.1021/nn700190t.