APA (7th ed.) Citation

Charrier, D. S. H., Kemerink, M., Smalbrugge, B. E., Vries, T. d., & Janssen, R. A. J. (2008). Real versus measured surface potentials in scanning Kelvin probe microscopy. ACS nano, 2(4), . https://doi.org/10.1021/nn700190t

Chicago Style (17th ed.) Citation

Charrier, Dimitri S. H., Martijn Kemerink, Barry E. Smalbrugge, Tjibbe de Vries, and René A. J. Janssen. "Real Versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy." ACS Nano 2, no. 4 (2008). https://doi.org/10.1021/nn700190t.

MLA (9th ed.) Citation

Charrier, Dimitri S. H., et al. "Real Versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy." ACS Nano, vol. 2, no. 4, 2008, https://doi.org/10.1021/nn700190t.