Comparing traceability through information retrieval, commits, interaction logs, and tags
Traceability is used to follow and understand the relationships between various software engineering artifacts such as requirements and source code. Comprehensive traceability of software engineering artifacts is important to ensure that a software can be further developed or maintained. Traceabilit...
Gespeichert in:
| Hauptverfasser: | , , |
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| Dokumenttyp: | Article (Journal) Kapitel/Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
05 September 2019
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| In: |
IEEE Xplore digital library
Year: 2019, Pages: 21-28 |
| ISSN: | 2473-2001 |
| DOI: | 10.1109/SST.2019.00015 |
| Online-Zugang: | Resolving-System, Volltext: https://doi.org/10.1109/SST.2019.00015 Verlag: https://ieeexplore.ieee.org/document/8823789 
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| Verfasserangaben: | Marcus Seiler, Paul Hübner, Barbara Paech |
MARC
| LEADER | 00000caa a22000002c 4500 | ||
|---|---|---|---|
| 001 | 168718383X | ||
| 003 | DE-627 | ||
| 005 | 20220817203200.0 | ||
| 007 | cr uuu---uuuuu | ||
| 008 | 200113s2019 xx |||||o 00| ||eng c | ||
| 024 | 7 | |a 10.1109/SST.2019.00015 |2 doi | |
| 035 | |a (DE-627)168718383X | ||
| 035 | |a (DE-599)KXP168718383X | ||
| 035 | |a (OCoLC)1341297737 | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rda | ||
| 041 | |a eng | ||
| 084 | |a 28 |2 sdnb | ||
| 100 | 1 | |a Seiler, Marcus |e VerfasserIn |0 (DE-588)113209920X |0 (DE-627)88739096X |0 (DE-576)488627850 |4 aut | |
| 245 | 1 | 0 | |a Comparing traceability through information retrieval, commits, interaction logs, and tags |c Marcus Seiler, Paul Hübner, Barbara Paech |
| 264 | 1 | |c 05 September 2019 | |
| 300 | |a 8 | ||
| 336 | |a Text |b txt |2 rdacontent | ||
| 337 | |a Computermedien |b c |2 rdamedia | ||
| 338 | |a Online-Ressource |b cr |2 rdacarrier | ||
| 500 | |a Gesehen am 13.01.2020 | ||
| 520 | |a Traceability is used to follow and understand the relationships between various software engineering artifacts such as requirements and source code. Comprehensive traceability of software engineering artifacts is important to ensure that a software can be further developed or maintained. Traceability links are often created manually by using commit ids or retrospectively by using information retrieval (IR). However, creating traceability links manually is costly and it is error-prone in retrospect. As part of our ongoing research on feature management where traceability is also of interest, we use a lightweight tagging approach to relate artifacts. We want to investigate how such a tag-based approach compares to approaches using commit ids, interaction logs (IL), and IR for creating traceability links. | ||
| 650 | 4 | |a commit ids | |
| 650 | 4 | |a commit-based IL-based approach | |
| 650 | 4 | |a Distance measurement | |
| 650 | 4 | |a information retrieval | |
| 650 | 4 | |a interaction logs | |
| 650 | 4 | |a interaction tags | |
| 650 | 4 | |a IR-based approaches | |
| 650 | 4 | |a Large scale integration | |
| 650 | 4 | |a program diagnostics | |
| 650 | 4 | |a Software engineering | |
| 650 | 4 | |a software maintenance | |
| 650 | 4 | |a tag-based approach | |
| 650 | 4 | |a tagging | |
| 650 | 4 | |a traceability | |
| 650 | 4 | |a traceability links | |
| 700 | 1 | |a Hübner, Paul |d 1982- |e VerfasserIn |0 (DE-588)1163037974 |0 (DE-627)1027279678 |0 (DE-576)507753631 |4 aut | |
| 700 | 1 | |a Paech, Barbara |d 1959- |e VerfasserIn |0 (DE-588)172299799 |0 (DE-627)697208648 |0 (DE-576)133166821 |4 aut | |
| 773 | 0 | 8 | |i Enthalten in |a Institute of Electrical and Electronics Engineers |t IEEE Xplore digital library |d New York, NY : IEEE, 2000 |g (2019), Seite 21-28 |h Online-Ressource |w (DE-627)360060005 |w (DE-600)2098813-8 |w (DE-576)117033723 |x 2473-2001 |7 nnas |
| 773 | 1 | 8 | |g year:2019 |g pages:21-28 |g extent:8 |a Comparing traceability through information retrieval, commits, interaction logs, and tags |
| 856 | 4 | 0 | |u https://doi.org/10.1109/SST.2019.00015 |x Resolving-System |x Verlag |3 Volltext |
| 856 | 4 | 0 | |u https://ieeexplore.ieee.org/document/8823789 |x Verlag |
| 951 | |a AR | ||
| 992 | |a 20200113 | ||
| 993 | |a Article | ||
| 994 | |a 2019 | ||
| 998 | |g 172299799 |a Paech, Barbara |m 172299799:Paech, Barbara |d 110000 |d 110300 |e 110000PP172299799 |e 110300PP172299799 |k 0/110000/ |k 1/110000/110300/ |p 3 |y j | ||
| 998 | |g 1163037974 |a Hübner, Paul |m 1163037974:Hübner, Paul |p 2 | ||
| 998 | |g 113209920X |a Seiler, Marcus |m 113209920X:Seiler, Marcus |d 110000 |d 110300 |e 110000PS113209920X |e 110300PS113209920X |k 0/110000/ |k 1/110000/110300/ |p 1 |x j | ||
| 999 | |a KXP-PPN168718383X |e 3574612311 | ||
| BIB | |a Y | ||
| JSO | |a {"type":{"bibl":"chapter","media":"Online-Ressource"},"title":[{"title_sort":"Comparing traceability through information retrieval, commits, interaction logs, and tags","title":"Comparing traceability through information retrieval, commits, interaction logs, and tags"}],"name":{"displayForm":["Marcus Seiler, Paul Hübner, Barbara Paech"]},"id":{"eki":["168718383X"],"doi":["10.1109/SST.2019.00015"]},"origin":[{"dateIssuedDisp":"05 September 2019","dateIssuedKey":"2019"}],"relHost":[{"origin":[{"dateIssuedKey":"2000","publisher":"IEEE","publisherPlace":"New York, NY","dateIssuedDisp":"2000-"}],"part":{"pages":"21-28","text":"(2019), Seite 21-28","extent":"8","year":"2019"},"id":{"eki":["360060005"],"issn":["2473-2001"],"zdb":["2098813-8"]},"name":{"displayForm":["IEEE"]},"title":[{"title_sort":"IEEE Xplore digital library","title":"IEEE Xplore digital library"}],"titleAlt":[{"title":"IEEE IET electronic library"},{"title":"IEL"},{"title":"IEEE standards"},{"title":"IEEE conference proceedings"},{"title":"IEE standards"},{"title":"IEE conference proceedings"},{"title":"IEEEXplore digital library"},{"title":"SMPTE standards"},{"title":"Inspec abstract citation and bibliographic records"},{"title":"IEEE Xplore"},{"title":"IEEE IEE electronic library"}],"note":["Gesehen am 20.12.10","Enth. Volltextzugang zu transactions, journals, magazines, conference proceedings u. standards von IEEE, IEE u. SMPTE und auf Inspec abstract/citation and bibliographic records"],"language":["eng"],"corporate":[{"role":"aut","roleDisplay":"VerfasserIn","display":"Institute of Electrical and Electronics Engineers"},{"display":"Institution of Engineering and Technology","role":"isb","roleDisplay":"Herausgebendes Organ"}],"recId":"360060005","physDesc":[{"extent":"Online-Ressource"}],"disp":"Institute of Electrical and Electronics EngineersIEEE Xplore digital library","type":{"media":"Online-Ressource","bibl":"book"}}],"physDesc":[{"extent":"8 S."}],"language":["eng"],"recId":"168718383X","note":["Gesehen am 13.01.2020"],"person":[{"role":"aut","roleDisplay":"VerfasserIn","display":"Seiler, Marcus","family":"Seiler","given":"Marcus"},{"roleDisplay":"VerfasserIn","role":"aut","display":"Hübner, Paul","given":"Paul","family":"Hübner"},{"family":"Paech","given":"Barbara","display":"Paech, Barbara","roleDisplay":"VerfasserIn","role":"aut"}]} | ||
| SRT | |a SEILERMARCCOMPARINGT0520 | ||