APA (7th ed.) Citation

Sultan, D. M. S., Schöning, A., Herkert, A., & Augustin, H. (2019). Electrical characterization of AMS aH18 HV-CMOS after neutrons and protons irradiation. Journal of Instrumentation, 14(5), . https://doi.org/10.1088/1748-0221/14/05/C05003

Chicago Style (17th ed.) Citation

Sultan, D. M. S., André Schöning, Adrian Herkert, and Heiko Augustin. "Electrical Characterization of AMS AH18 HV-CMOS After Neutrons and Protons Irradiation." Journal of Instrumentation 14, no. 5 (2019). https://doi.org/10.1088/1748-0221/14/05/C05003.

MLA (9th ed.) Citation

Sultan, D. M. S., et al. "Electrical Characterization of AMS AH18 HV-CMOS After Neutrons and Protons Irradiation." Journal of Instrumentation, vol. 14, no. 5, 2019, https://doi.org/10.1088/1748-0221/14/05/C05003.