Using light, X-rays and electrons for evaluation of the nanostructure of layered materials - Djamil, John; Hansen, Anna-Lena; Backes, Claudia; Bensch, Wolfgang; Schürmann, Ulrich; Kienle, Lorenz; Düvel, Andre; Heitjans, Paul (Nanoscale, 2018)
Gesehen am 26.03.2020