Hehn, I., Schuster, S., Wächter, T., Abu-Husein, T., Terfort, A., Zharnikov, M., & Zojer, E. (2016). Employing x-ray photoelectron spectroscopy for determining layer homogeneity in mixed polar self-assembled monolayers. The journal of physical chemistry letters, 7(15), . https://doi.org/10.1021/acs.jpclett.6b01096
Chicago Style (17th ed.) CitationHehn, Iris, Swen Schuster, Tobias Wächter, Tarek Abu-Husein, Andreas Terfort, Michael Zharnikov, and Egbert Zojer. "Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-assembled Monolayers." The Journal of Physical Chemistry Letters 7, no. 15 (2016). https://doi.org/10.1021/acs.jpclett.6b01096.
MLA (9th ed.) CitationHehn, Iris, et al. "Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-assembled Monolayers." The Journal of Physical Chemistry Letters, vol. 7, no. 15, 2016, https://doi.org/10.1021/acs.jpclett.6b01096.