An electron beam ion trap and source for re-acceleration of rare-isotope ion beams at TRIUMF
Electron beam driven ionization can produce highly charged ions (HCIs) in a few well-defined charge states. Ideal conditions for this are maximally focused electron beams and an extremely clean vacuum environment. A cryogenic electron beam ion trap fulfills these prerequisites and delivers very pure...
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| Main Authors: | , , , , , , , , , , , , |
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| Format: | Article (Journal) |
| Language: | English |
| Published: |
3 May 2018
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| In: |
Review of scientific instruments
Year: 2018, Volume: 89, Issue: 5 |
| ISSN: | 1089-7623 |
| DOI: | 10.1063/1.5021045 |
| Online Access: | Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1063/1.5021045 Verlag, lizenzpflichtig, Volltext: https://aip.scitation.org/doi/10.1063/1.5021045 |
| Author Notes: | M.A. Blessenohl, S. Dobrodey, C. Warnecke, M.K. Rosner, L. Graham, S. Paul, T.M. Baumann, Z. Hockenbery, R. Hubele, T. Pfeifer, F. Ames, J. Dilling, and J.R. Crespo López-Urrutia |
MARC
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| 520 | |a Electron beam driven ionization can produce highly charged ions (HCIs) in a few well-defined charge states. Ideal conditions for this are maximally focused electron beams and an extremely clean vacuum environment. A cryogenic electron beam ion trap fulfills these prerequisites and delivers very pure HCI beams. The Canadian rare isotope facility with electron beam ion source-electron beam ion sources developed at the Max-Planck-Institut für Kernphysik (MPIK) reaches already for a 5 keV electron beam and a current of 1 A with a density in excess of 5000 A/cm2 by means of a 6 T axial magnetic field. Within the trap, the beam quickly generates a dense HCI population, tightly confined by a space-charge potential of the order of 1 keV times the ionic charge state. Emitting HCI bunches of ≈107 ions at up to 100 Hz repetition rate, the device will charge-breed rare-isotope beams with the mass-over-charge ratio required for re-acceleration at the Advanced Rare IsotopE Laboratory (ARIEL) facility at TRIUMF. We present here its design and results from commissioning runs at MPIK, including X-ray diagnostics of the electron beam and charge-breeding process, as well as ion injection and HCI-extraction measurements. | ||
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