APA (7th ed.) Citation

Grab, A. L., Hagmann, M., Dahint, R., & Cremer, C. (2015). Localization microscopy (SPDM) facilitates high precision control of lithographically produced nanostructures. Micron, 68, . https://doi.org/10.1016/j.micron.2014.08.003

Chicago Style (17th ed.) Citation

Grab, Anna Luise, M. Hagmann, Reiner Dahint, and Christoph Cremer. "Localization Microscopy (SPDM) Facilitates High Precision Control of Lithographically Produced Nanostructures." Micron 68 (2015). https://doi.org/10.1016/j.micron.2014.08.003.

MLA (9th ed.) Citation

Grab, Anna Luise, et al. "Localization Microscopy (SPDM) Facilitates High Precision Control of Lithographically Produced Nanostructures." Micron, vol. 68, 2015, https://doi.org/10.1016/j.micron.2014.08.003.