An extreme-ultraviolet frequency comb enabling frequency metrology with highly charged ions
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An extreme-ultraviolet frequency comb enabling frequency metrology with highly charged ions
2020
- Resolving-System, kostenfrei
- Resolving-System, kostenfrei
- Verlag, kostenfrei, Volltext
- Resolving-System
- Langzeitarchivierung Nationalbibliothek
- Resolving-System
Book/Monograph
Hochschulschrift
Online Resource