Mapping impurity of single-walled carbon nanotubes in bulk samples with multiplex coherent anti-Stokes Raman microscopy
Mapping of defects in bulk samples of single-walled carbon nanotubes (SWNT) is performed via multiplex coherent anti-Stokes Raman microscopy. The D and G vibrational bands are acquired simultaneously, and their relative amplitude is used as a criterion to quantify the local purity in spin-coated SWN...
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| Hauptverfasser: | , , , , |
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| Dokumenttyp: | Article (Journal) |
| Sprache: | Englisch |
| Veröffentlicht: |
January 16, 2013
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| In: |
Nano letters
Year: 2013, Jahrgang: 13, Heft: 2, Pages: 697-702 |
| ISSN: | 1530-6992 |
| DOI: | 10.1021/nl304371x |
| Online-Zugang: | Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1021/nl304371x
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| Verfasserangaben: | Alex S. Duarte, Jean Rehbinder, Ricardo R.B. Correia, Tiago Buckup, and Marcus Motzkus |
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| 520 | |a Mapping of defects in bulk samples of single-walled carbon nanotubes (SWNT) is performed via multiplex coherent anti-Stokes Raman microscopy. The D and G vibrational bands are acquired simultaneously, and their relative amplitude is used as a criterion to quantify the local purity in spin-coated SWNT samples. We observe that defects induced by oxidation are related to the spatial dispersion of nanotubes in a solid distribution. | ||
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