Analysis of the charge state distribution in an ECRIS Ar plasma using high-resolution x-ray spectra
In this work, we obtained a charge state distribution inside an Ar plasma produced by an electron-cyclotron-resonance ion source. The processes that lead to the observed lines in x-ray spectra are identified and included in the simulated x-ray spectrum. The geometrical constraints of the flat double...
Gespeichert in:
| Hauptverfasser: | , |
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| Dokumenttyp: | Article (Journal) |
| Sprache: | Englisch |
| Veröffentlicht: |
1 March 2013
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| In: |
Journal of physics. B, Atomic, molecular and optical physics
Year: 2013, Jahrgang: 46, Heft: 6, Pages: 1-7 |
| ISSN: | 1361-6455 |
| DOI: | 10.1088/0953-4075/46/6/065701 |
| Online-Zugang: | Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1088/0953-4075/46/6/065701
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| Verfasserangaben: | M Guerra, P Amaro, CI Szabo, A Gumberidze, P Indelicato and JP Santos |
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| 520 | |a In this work, we obtained a charge state distribution inside an Ar plasma produced by an electron-cyclotron-resonance ion source. The processes that lead to the observed lines in x-ray spectra are identified and included in the simulated x-ray spectrum. The geometrical constraints of the flat double crystal spectrometer, used to measure the x-ray spectrum, are investigated as they are crucial for correctly obtaining the ion densities from the observed transition amplitudes. Multiple electron impact ionization is included, and a realistic electron velocity distribution is taken into account. The charge state distribution of the Ar ions is compared to measured extracted ionic currents. | ||
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