Cover Image

Photoemission spectroscopy study of structural defects in molybdenum disulfide (MoS2) grown by chemical vapor deposition (CVD)

The fingerprint of structural defects in CVD grown MoS2 was revealed by means of X-ray Photoelectron Spectroscopy (XPS). These defects can be partially healed by grafting thiol-functionalized molecules. The functionalization does not alter the semiconducting properties of MoS2 as confirmed by the ph...

Full description

Saved in:
Bibliographic Details
Main Authors: Syari’ati, Ali (Author) , Kumar, Sumit (Author) , Zahid, Amara (Author) , El Yumin, Abdurrahman Ali (Author) , Ye, Jianting (Author) , Rudolf, Petra (Author)
Format: Article (Journal)
Language:English
Published: 03 Aug 2019
In: Chemical communications
Year: 2019, Volume: 55, Issue: 70, Pages: 10384-10387
ISSN:1364-548X
DOI:10.1039/C9CC01577A
Online Access:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1039/C9CC01577A
Verlag, lizenzpflichtig, Volltext: https://pubs.rsc.org/en/content/articlelanding/2019/cc/c9cc01577a
Get full text
Author Notes:Ali Syari’ati, Sumit Kumar, Amara Zahid, Abdurrahman Ali El Yumin, Jianting Ye and Petra Rudolf
Description
Summary:The fingerprint of structural defects in CVD grown MoS2 was revealed by means of X-ray Photoelectron Spectroscopy (XPS). These defects can be partially healed by grafting thiol-functionalized molecules. The functionalization does not alter the semiconducting properties of MoS2 as confirmed by the photoluminescence spectra.
Item Description:Im Titel ist "2" bei MoS2 tiefgestellt
Gesehen am 11.03.2021
Physical Description:Online Resource
ISSN:1364-548X
DOI:10.1039/C9CC01577A

Similar Items