Photoemission spectroscopy study of structural defects in molybdenum disulfide (MoS2) grown by chemical vapor deposition (CVD)
The fingerprint of structural defects in CVD grown MoS2 was revealed by means of X-ray Photoelectron Spectroscopy (XPS). These defects can be partially healed by grafting thiol-functionalized molecules. The functionalization does not alter the semiconducting properties of MoS2 as confirmed by the ph...
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| Hauptverfasser: | , , , , , |
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| Dokumenttyp: | Article (Journal) |
| Sprache: | Englisch |
| Veröffentlicht: |
03 Aug 2019
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| In: |
Chemical communications
Year: 2019, Jahrgang: 55, Heft: 70, Pages: 10384-10387 |
| ISSN: | 1364-548X |
| DOI: | 10.1039/C9CC01577A |
| Online-Zugang: | Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1039/C9CC01577A Verlag, lizenzpflichtig, Volltext: https://pubs.rsc.org/en/content/articlelanding/2019/cc/c9cc01577a 
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| Verfasserangaben: | Ali Syari’ati, Sumit Kumar, Amara Zahid, Abdurrahman Ali El Yumin, Jianting Ye and Petra Rudolf |
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| 520 | |a The fingerprint of structural defects in CVD grown MoS2 was revealed by means of X-ray Photoelectron Spectroscopy (XPS). These defects can be partially healed by grafting thiol-functionalized molecules. The functionalization does not alter the semiconducting properties of MoS2 as confirmed by the photoluminescence spectra. | ||
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