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Broadband mid-infrared phase retrieval for nonlinear microscopy

Spectral phase characterization of ultrashort laser pulses is essential in nonlinear micro-spectroscopy. Whereas in many applications phases are determined for near-infrared (NIR) pulses, successful mid-infrared (MIR) phase retrieval is rare. The spectral phase of ultra-broadband MIR pulses is deter...

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Bibliographic Details
Main Authors: Müller, Niklas (Author) , Nicolai, Florian (Author) , Buckup, Tiago (Author)
Format: Article (Journal)
Language:English
Published: September 30, 2021
In: Optics letters
Year: 2021, Volume: 46, Issue: 19, Pages: 5012-5015
ISSN:1539-4794
DOI:10.1364/OL.440344
Online Access:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1364/OL.440344
Verlag, lizenzpflichtig, Volltext: https://www.osapublishing.org/ol/abstract.cfm?uri=ol-46-19-5012
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Author Notes:Niklas Müller, Florian Nicolai, and Tiago Buckup

MARC

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520 |a Spectral phase characterization of ultrashort laser pulses is essential in nonlinear micro-spectroscopy. Whereas in many applications phases are determined for near-infrared (NIR) pulses, successful mid-infrared (MIR) phase retrieval is rare. The spectral phase of ultra-broadband MIR pulses is determined over more than 1000cm−1 in the presented work. This is accomplished by exploiting the d-scan method in two variants. Both allow for detecting high signals by using the interaction of the MIR and NIR pulses. The two variants differ in imprinting the dispersion. While the dual d-scan imprints phases on both pulses, the Xd-scan method disperses the NIR pulses solely. 
650 4 |a Electric fields 
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650 4 |a Spectral phase interferometry for direct field reconstruction 
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