Pressure cell for investigations of solid-liquid interfaces by neutron reflectivity
We describe an apparatus for measuring scattering length density and structure of molecular layers at planar solid-liquid interfaces under high hydrostatic pressure conditions. The device is designed for in situ characterizations utilizing neutron reflectometry in the pressure range 0.1-100 MPa at t...
Gespeichert in:
| Hauptverfasser: | , , , , |
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| Dokumenttyp: | Article (Journal) |
| Sprache: | Englisch |
| Veröffentlicht: |
09 February 2011
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| In: |
Review of scientific instruments
Year: 2011, Jahrgang: 82, Heft: 2, Pages: 1-8 |
| ISSN: | 1089-7623 |
| DOI: | 10.1063/1.3505797 |
| Online-Zugang: | Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1063/1.3505797 Verlag, lizenzpflichtig, Volltext: https://aip.scitation.org/doi/10.1063/1.3505797 
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| Verfasserangaben: | Martin Kreuzer, Thomas Kaltofen, Roland Steitz, Beat H. Zehnder, Reiner Dahint |
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| 520 | |a We describe an apparatus for measuring scattering length density and structure of molecular layers at planar solid-liquid interfaces under high hydrostatic pressure conditions. The device is designed for in situ characterizations utilizing neutron reflectometry in the pressure range 0.1-100 MPa at temperatures between 5 and 60 °C. The pressure cell is constructed such that stratified molecular layers on crystalline substrates of silicon, quartz, or sapphire with a surface area of 28 cm2 can be investigated against noncorrosive liquid phases. The large substrate surface area enables reflectivity to be measured down to 10−5 (without background correction) and thus facilitates determination of the scattering length density profile across the interface as a function of applied load. Our current interest is on the stability of oligolamellar lipid coatings on silicon surfaces against aqueous phases as a function of applied hydrostatic pressure and temperature but the device can also be employed to probe the structure of any other solid-liquid interface. | ||
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