Salingue, N., & Hess, P. (2011). Preparation, IR spectroscopy, and time-of-flight mass spectrometry of halogenated and methylated Si(111). Applied physics. A, Materials science & processing, 104(3), . https://doi.org/10.1007/s00339-011-6483-0
Chicago Style (17th ed.) CitationSalingue, Nils, and Peter Hess. "Preparation, IR Spectroscopy, and Time-of-flight Mass Spectrometry of Halogenated and Methylated Si(111)." Applied Physics. A, Materials Science & Processing 104, no. 3 (2011). https://doi.org/10.1007/s00339-011-6483-0.
MLA (9th ed.) CitationSalingue, Nils, and Peter Hess. "Preparation, IR Spectroscopy, and Time-of-flight Mass Spectrometry of Halogenated and Methylated Si(111)." Applied Physics. A, Materials Science & Processing, vol. 104, no. 3, 2011, https://doi.org/10.1007/s00339-011-6483-0.