Baddeley, D., Weiland, Y., Batram, C., Birk, U., & Cremer, C. (2010). Model based precision structural measurements on barely resolved objects. Journal of microscopy, 237(1), . https://doi.org/10.1111/j.1365-2818.2009.03304.x
Chicago-Zitierstil (17. Ausg.)Baddeley, David, Y. Weiland, C. Batram, U. Birk, und Christoph Cremer. "Model Based Precision Structural Measurements on Barely Resolved Objects." Journal of Microscopy 237, no. 1 (2010). https://doi.org/10.1111/j.1365-2818.2009.03304.x.
MLA-Zitierstil (9. Ausg.)Baddeley, David, et al. "Model Based Precision Structural Measurements on Barely Resolved Objects." Journal of Microscopy, vol. 237, no. 1, 2010, https://doi.org/10.1111/j.1365-2818.2009.03304.x.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.