APA-Zitierstil (7. Ausg.)

Sanakoyeu, A., Ma, P., Tschernezki, V., & Ommer, B. (2022). Improving deep metric learning by divide and conquer. IEEE transactions on pattern analysis and machine intelligence, 44(11), . https://doi.org/10.1109/TPAMI.2021.3113270

Chicago-Zitierstil (17. Ausg.)

Sanakoyeu, Artsiom, Pingchuan Ma, Vadim Tschernezki, und Björn Ommer. "Improving Deep Metric Learning by Divide and Conquer." IEEE Transactions on Pattern Analysis and Machine Intelligence 44, no. 11 (2022). https://doi.org/10.1109/TPAMI.2021.3113270.

MLA-Zitierstil (9. Ausg.)

Sanakoyeu, Artsiom, et al. "Improving Deep Metric Learning by Divide and Conquer." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 44, no. 11, 2022, https://doi.org/10.1109/TPAMI.2021.3113270.