Relationship between microtensile bond strength and submicron hiatus at the composite-dentin interface using CLSM visualization technique

Objectives - “Submicron hiatus” represents a potential space between the base of the collagenous network and the mineralized dentin when it is acid etched for bonding. This study evaluated the relationship between microtensile bond strength (μTBS) and occurrence of submicron hiatus formations at the...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Ding, Paul Georg Friedrich (VerfasserIn) , Matzer, Axel Rolf Arthur Hermann (VerfasserIn) , Wolff, Diana (VerfasserIn) , Mente, Johannes (VerfasserIn) , Pioch, Thomas (VerfasserIn) , Staehle, Hans Jörg (VerfasserIn) , Dannewitz, Bettina (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: 2010
In: Dental materials
Year: 2010, Jahrgang: 26, Heft: 3, Pages: 257-263
ISSN:1879-0097
DOI:10.1016/j.dental.2009.11.003
Online-Zugang:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1016/j.dental.2009.11.003
Verlag, lizenzpflichtig, Volltext: https://www.sciencedirect.com/science/article/pii/S0109564109003388
Volltext
Verfasserangaben:Paul G.F. Ding, Axel R.A.H. Matzer, Diana Wolff, Johannes Mente, Thomas Pioch, Hans Jörg Staehle, Bettina Dannewitz

MARC

LEADER 00000caa a2200000 c 4500
001 1833251393
003 DE-627
005 20230710160801.0
007 cr uuu---uuuuu
008 230206s2010 xx |||||o 00| ||eng c
024 7 |a 10.1016/j.dental.2009.11.003  |2 doi 
035 |a (DE-627)1833251393 
035 |a (DE-599)KXP1833251393 
035 |a (OCoLC)1389821820 
040 |a DE-627  |b ger  |c DE-627  |e rda 
041 |a eng 
084 |a 33  |2 sdnb 
100 1 |a Ding, Paul Georg Friedrich  |d 1980-  |e VerfasserIn  |0 (DE-588)130253138  |0 (DE-627)495832774  |0 (DE-576)298089491  |4 aut 
245 1 0 |a Relationship between microtensile bond strength and submicron hiatus at the composite-dentin interface using CLSM visualization technique  |c Paul G.F. Ding, Axel R.A.H. Matzer, Diana Wolff, Johannes Mente, Thomas Pioch, Hans Jörg Staehle, Bettina Dannewitz 
264 1 |c 2010 
300 |a 7 
336 |a Text  |b txt  |2 rdacontent 
337 |a Computermedien  |b c  |2 rdamedia 
338 |a Online-Ressource  |b cr  |2 rdacarrier 
500 |a Available online: 5 December 2009 
500 |a Gesehen am 06.02.2023 
520 |a Objectives - “Submicron hiatus” represents a potential space between the base of the collagenous network and the mineralized dentin when it is acid etched for bonding. This study evaluated the relationship between microtensile bond strength (μTBS) and occurrence of submicron hiatus formations at the resin-dentin interface using the same specimens. - Methods - Resin-dentin bonded micro-specimens (sticks with a size of 300μm×300μm×8mm) were prepared using one of two material combinations (group I: Syntac Classic/Tetric Ceram Cavifil: n=51 group II: Prime & Bond NT/Tetric Ceram Cavifil: n=56). After labeling the primer component with a tiny amount of rhodamine-B-isothiocyanate, submicron hiatus formations were imaged nondestructively using a confocal laser scanning microscope (CLSM). Subsequently specimens were subjected to a μTBS test. - Results - For the influence of submicron hiatus formations on μTBS with the Syntac Classic group, the nonparametric Spearman's correlation was −0.329 at p=0.02. For the Prime & Bond NT group, the nonparametric Spearman's correlation was −0.356 at p=0.007. Analyzing the effect of submicron hiatus on without discriminating by group resulted in a Spearman's correlation coefficient of −0.341 at p=0.001; μTBS and quality of hybrid layer showed a correlation coefficient of 0.849 at p=0.001, and μTBS and quality of tag formation showed a correlation coefficient of 0.474 at p=0.001. - Significance - The degree of submicron hiatus formations had an influence on microtensile bond strength for both the Syntac Classic and the Prime & Bond NT group. 
650 4 |a Adhesion 
650 4 |a Bonding interface 
650 4 |a Dentin 
650 4 |a Microtensile bond strength 
650 4 |a Resin 
650 4 |a Submicron hiatus 
700 1 |a Matzer, Axel Rolf Arthur Hermann  |d 1977-  |e VerfasserIn  |0 (DE-588)12970010X  |0 (DE-627)477592562  |0 (DE-576)297792717  |4 aut 
700 1 |a Wolff, Diana  |d 1976-  |e VerfasserIn  |0 (DE-588)128783176  |0 (DE-627)379683377  |0 (DE-576)302560351  |4 aut 
700 1 |a Mente, Johannes  |d 1967-  |e VerfasserIn  |0 (DE-588)121734870  |0 (DE-627)705633756  |0 (DE-576)292857446  |4 aut 
700 1 |a Pioch, Thomas  |d 1956-  |e VerfasserIn  |0 (DE-588)1094919160  |0 (DE-627)85537814X  |0 (DE-576)166185558  |4 aut 
700 1 |a Staehle, Hans Jörg  |d 1953-  |e VerfasserIn  |0 (DE-588)172383102  |0 (DE-627)697325644  |0 (DE-576)133247309  |4 aut 
700 1 |a Dannewitz, Bettina  |d 1973-  |e VerfasserIn  |0 (DE-588)123028531  |0 (DE-627)082303479  |0 (DE-576)293526400  |4 aut 
773 0 8 |i Enthalten in  |t Dental materials  |d Amsterdam : Elsevier, 1985  |g 26(2010), 3 vom: März, Seite 257-263  |h Online-Ressource  |w (DE-627)320507300  |w (DE-600)2012987-7  |w (DE-576)094752583  |x 1879-0097  |7 nnas  |a Relationship between microtensile bond strength and submicron hiatus at the composite-dentin interface using CLSM visualization technique 
773 1 8 |g volume:26  |g year:2010  |g number:3  |g month:03  |g pages:257-263  |g extent:7  |a Relationship between microtensile bond strength and submicron hiatus at the composite-dentin interface using CLSM visualization technique 
856 4 0 |u https://doi.org/10.1016/j.dental.2009.11.003  |x Verlag  |x Resolving-System  |z lizenzpflichtig  |3 Volltext 
856 4 0 |u https://www.sciencedirect.com/science/article/pii/S0109564109003388  |x Verlag  |z lizenzpflichtig  |3 Volltext 
951 |a AR 
992 |a 20230206 
993 |a Article 
994 |a 2010 
998 |g 123028531  |a Dannewitz, Bettina  |m 123028531:Dannewitz, Bettina  |d 910000  |d 910800  |e 910000PD123028531  |e 910800PD123028531  |k 0/910000/  |k 1/910000/910800/  |p 7  |y j 
998 |g 172383102  |a Staehle, Hans Jörg  |m 172383102:Staehle, Hans Jörg  |d 910000  |d 910800  |e 910000PS172383102  |e 910800PS172383102  |k 0/910000/  |k 1/910000/910800/  |p 6 
998 |g 121734870  |a Mente, Johannes  |m 121734870:Mente, Johannes  |d 910000  |d 910800  |e 910000PM121734870  |e 910800PM121734870  |k 0/910000/  |k 1/910000/910800/  |p 4 
998 |g 128783176  |a Wolff, Diana  |m 128783176:Wolff, Diana  |d 910000  |d 910800  |e 910000PW128783176  |e 910800PW128783176  |k 0/910000/  |k 1/910000/910800/  |p 3 
999 |a KXP-PPN1833251393  |e 4267424519 
BIB |a Y 
SER |a journal 
JSO |a {"id":{"doi":["10.1016/j.dental.2009.11.003"],"eki":["1833251393"]},"type":{"bibl":"article-journal","media":"Online-Ressource"},"name":{"displayForm":["Paul G.F. Ding, Axel R.A.H. Matzer, Diana Wolff, Johannes Mente, Thomas Pioch, Hans Jörg Staehle, Bettina Dannewitz"]},"language":["eng"],"recId":"1833251393","physDesc":[{"extent":"7 S."}],"person":[{"display":"Ding, Paul Georg Friedrich","role":"aut","family":"Ding","given":"Paul Georg Friedrich"},{"given":"Axel Rolf Arthur Hermann","family":"Matzer","role":"aut","display":"Matzer, Axel Rolf Arthur Hermann"},{"family":"Wolff","given":"Diana","display":"Wolff, Diana","role":"aut"},{"family":"Mente","given":"Johannes","display":"Mente, Johannes","role":"aut"},{"family":"Pioch","given":"Thomas","display":"Pioch, Thomas","role":"aut"},{"family":"Staehle","given":"Hans Jörg","role":"aut","display":"Staehle, Hans Jörg"},{"role":"aut","display":"Dannewitz, Bettina","family":"Dannewitz","given":"Bettina"}],"title":[{"title":"Relationship between microtensile bond strength and submicron hiatus at the composite-dentin interface using CLSM visualization technique","title_sort":"Relationship between microtensile bond strength and submicron hiatus at the composite-dentin interface using CLSM visualization technique"}],"relHost":[{"physDesc":[{"extent":"Online-Ressource"}],"note":["Gesehen am 04.02.20"],"origin":[{"publisherPlace":"Amsterdam","dateIssuedKey":"1985","publisher":"Elsevier","dateIssuedDisp":"1985-"}],"pubHistory":["1.1985 -"],"id":{"issn":["1879-0097"],"eki":["320507300"],"zdb":["2012987-7"]},"recId":"320507300","title":[{"subtitle":"official publication of the Academy of Dental Materials","title":"Dental materials","title_sort":"Dental materials"}],"part":{"issue":"3","text":"26(2010), 3 vom: März, Seite 257-263","pages":"257-263","extent":"7","year":"2010","volume":"26"},"disp":"Relationship between microtensile bond strength and submicron hiatus at the composite-dentin interface using CLSM visualization techniqueDental materials","type":{"bibl":"periodical","media":"Online-Ressource"},"language":["eng"]}],"origin":[{"dateIssuedDisp":"2010","dateIssuedKey":"2010"}],"note":["Available online: 5 December 2009","Gesehen am 06.02.2023"]} 
SRT |a DINGPAULGERELATIONSH2010